Develop Test Chip with Next-generation Semiconductor IP Core Called a DFP

NSITEXE Develops Test Chip with Next-generation Semiconductor IP Core Called a DFP –Exhibiting a test chip using a DFP and its test board at the 11th AUTOMOTIVE WORLD–   NSITEXE Inc. will join the 11th AUTOMOTIVE WORLD to be held at Tokyo Big Sight from Wednesday, January 16 to Friday, January 18, 2019. At the event, NSITEXE will unveil a test chip with a next-generation IP core (Data...
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